nCATS Facility has two contact-based profilometers. The first is laboratory-based system: Taylor-Hobson Talysurf 120L and the second is a portable system Surtronic S100.
nCATS Facility has two contact-based profilometers. The first is laboratory-based system: Taylor-Hobson intra touch and the second is a portable system Surtronic S100. The portable system offers the ability to measure surfaces not accessible to the laboratory system, such as very large objects or fixed emplacements, this has been used on rail lines.
Both systems employ a contacting stylus with a hard tip that runs over the measurement surface, the deflection of the stylus is recorded and the roughness and form can be assessed.
The Intra Touch employs a 50 mm traverse unit (maximum scan length) and a inductive transducer. Typically we employ at stylus with a range of 1 mm (maximum height range), that has diamond conisphere tip with radius of 2 microns.
In terms of metrological measurements this will perform a single 2D profile, fairly quickly (typical in about a minute or two). Being a contact system it will measure any surface from transparent and translucent glass and plastics to most engineering surfaces. With the limited gauge range we have to be a little careful with large form variations, also the diamond tip can be damaged/removed by very rough surface or deep pockets.
System Performance | |||
---|---|---|---|
Straightness (over 50 mm) | 0.2 µm | ||
Straightness (over 20 mm) | 0.15 µm | ||
Gauge type | High precision | Wide range | |
Stylus range | 1 mm | 2 mm | 20 mm |
Radius accuracy (10 - 25 mm) | 0.04% | ||
Radius accuracy (25 - 100 mm) | 0.08% | 0.04 - 0.1% | |
System noise (Rq) | 8 nm | 50 nm | |
Slope accuracy | 0.5 arc minutes | 2 arc minutes | |
Horizontal Performance | |||
Traverse length - X Min / Max | 0.1 mm to 50 mm | ||
Traverse speed | 10 mm/s max | ||
Measuring speeds | 0.25 mm/s, 0.5 mm/s, 1 mm/s, & 2 mm/s | ||
Data sampling interval in X | 0.5 µm | ||
Vertical Performance | High precision | Wide range | |
Nominal Z (Range 1) | 1 mm | 2 mm | 20 mm |
Resolution (Range 1) | 4 nm | 8 nm | 75 nm |
Nominal Z (Range 2) | 0.2 mm | 0.4 mm | 4 mm |
Resolution (Range 2) | 0.8 nm | 1.6 nm | 15 nm |
Roughness stylus max. force | 1 mN | 3.5 mN | |
Range to resolution ratio | 262,144 : 1 |
The Surtronic S100 portable Surface Finish Meter offers a versatile solution for your roughness measurement requirements. Features include a large ruggedized display, long-life batteries and simple menu structure. The Surtronic can be used either freestanding (on horizontal, vertical or even inverted surfaces) or bench mounted with fixturing for batch surface roughness measurement and laboratory applications.
The 50mm stylus lift with right angle attachment and over 70mm stylus reach ensure that even the most challenging surface can be measured without the need for expensive fixturing. Anti-slip V-feet allow the Surtronic to be used on flat or curved surfaces.
The Surtronic S100 is extremely durable, featuring impact resistant rubberised mouldings surrounding a recessed, high durability touchscreen.
S128 model | S116 model | |
---|---|---|
Gauge range: | 400µm | 200µm |
Resolution: | 50nm | 100nm |
Noise Floor (Ra): | 150 nm | 250nm |
Repeatability (Ra): | 0.5% of value + noise | 1% of value + noise |
Traverse Length: | 0.25-25mm | 0.25-12.5mm |
Below is a list of the most commonly used surface finish parameters, note R can be also be S in 3D roughness.
Parameter | Meaning |
---|---|
Ra | Arithmetic Mean Deviation |
Rq | Root mean square |
Rv | Maximum depth of profile below the mean line within the sampling length |
Rp | Maximum depth of profile above the mean line within the sampling length |
Rt | Total height of profile |
Rsk | Skewness |
Rku | Kurtosis |
Rz | Average peak to valley height |
Rsm | Mean width of profile elements |