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Research project

Compact imaging system for semiconductor inspection based on metalenses

Staff

Lead researchers

Dr Bruce (Jun-Yu) Ou

Associate Professor

Research interests

  • Metalens for imaging and metrology
  • AI for nanoimaging
  • Nano-optomechanics
Connect with Bruce (Jun-Yu)

Email: [email protected]

Research outputs

2D super-resolution metrology based on superoscillatory light
Yu Wang, Eng Aik Chan, Carolina Rendon-Barraza, Yijie Shen, Eric Plum & Bruce (Jun-Yu) Ou, 2024, Advanced Science, 11(38)
DOI: 10.1002/advs.202404607
Type: article
Near-infrared metalens empowered dual-mode high resolution and large FOV microscope
Chuang Sun, Hailong Pi, Kian Shen Kiang, Jize Yan & Jun-Yu Ou, 2024, Advanced Optical Materials, 12(21)
DOI: 10.1002/adom.202400512
Type: article
Tunable on-chip optical traps for levitating particles based on single-layer metasurface
Chuang Sun, Hailong Pi, Kian Shen Kiang, Tiberius S. Georgescu, Jun-Yu Ou, Hendrik Ulbricht & Jize Yan, 2024, Nanophotonics
DOI: 10.1515/nanoph-2023-0873
Type: article