Publications 1 publication Page 1 of 1 An ultra high-endurance memristor using back-end-of-line amorphous SiC Omesh Kapur, Dongkai Guo, Jamie Reynolds, Daniel William Newbrook, Yisong Han, Richard Beanland, Liudi Jiang, Kees De Groot & Ruomeng Huang, 2024, Scientific Reports Type: article