Electron beam lithography facility

About the Electron beam lithography facility

Part of the Zepler Cleanrooms

Our Electron Beam Lithography (EBL) facility hosts the first 200 kilovolt (kV) system outside of Japan - the JEOL JBX-8100 G3. The high acceleration voltage allows ultra-high resolution processing of fine structures to sub-5 nanometres (nm). This can be achieved in thick resist - up to 10 micrometres (μm) - with almost vertical sidewalls. 

Using the higher kV setting, we can also extend its use beyond lithography to electron displacement. 

The system creates new opportunities for fine-geometry capability in novel device fabrication, across electronics, photonics, and bio-nano technology. It is available for collaborative research.

The facility is supported by a grant from the Engineering and Physical Sciences Research Council (EPSRC). 

Read the grant page on the EPSRC website

Read the news piece on the JBX-8100 G3


 

The wider EBL facility

We have developed lithography processes for a number resist types, detailed in the technical specification.

We use Genisys software to carry out pattern optimisation. This enhances the high resolution and throughput of the electron beam. Using patterns created from CAD files, we can make rapid design changes without photomasks. 

We have dedicated spin coaters and hotplates for electron beam resist coating processes.

Our EBL tools are integrated with the latest ultra-high-resolution scanning electron microscope (SEM), the JEOL IT-800i. This is optimised for semiconductor materials and fabrication characterisation purposes. The facility can also provide “mix and match” lithography, in conjunction with the deep-ultraviolet scanner

In late 2024, the facility will receive a second EBL tool, the JEOL JBX-A9, a high-volume 300 mm wafer, 100kV tool. This will also be the first of its type outside of Japan.

Technical specification

EBL system - JEOL JBX-8100FS G3 

  • operating at 100kV and 200kV 
  • current range 100 picoamperes to 200 nanoamperes
  • up to 200 megahertz scan speed 
  • substrate sizes up to 200mm 
  • minimum feature size <10nm 
  • 12 cassette autoloader 
  • 1.6nm minimum spot size (at 100kV) 
  • high throughput mode: +/-20nm overlay and stitching accuracy; data increment 0.5μm 
  • high resolution mode: +/-9nm overlay stitching accuracy; data increment 0.05μm 
  • field size: 1x1mm at 100kV; 0.5 x 0.5mm at 200kV

EBL system - JEOL JBX-8100FS G3

JEOL JBX-8100FS G3

 

EBL system - JEOL JBX-A9 

  • operating at 100kV 
  • substrate size up to 300mm 
  • semi-production manufacture 
  • high reproducibility 
  • high throughput 
  • 1x1mm field size

EBL system - JEOL JBX-A9

JEOL JBX-A9

 

SEM system - JEOL IT-800i 

Full technical specification of the JEOL IT-800i

  • ultra-high resolution SEM optimised for semiconductors 
  • 0.5nm resolution 
  • substrate sizes up to 200mm 
  • SEM supporter – link EBL design to SEM inspection map 
  • 60mm² real-time x-ray energy dispersive spectroscopy (EDS)

SEM system - JEOL IT-800i

JEOL IT-800i

 

Resist types

We have developed lithography processes for the following resist types:

 

Pattern optimisation software

 

 

Connect

Contact us

For more information or to book the facilities, email us: