Research project

Resilient and Testble Energy-Efficient Digital Hardware

Lead researchers:

Professor Bashir Al-Hashimi
Research funder:

EPSRC
Status:

Not active

Staff

Lead researchers

Professor Bashir Al-Hashimi CBE, FREng, FIEEE, FIET, FBCS

Research interests

Energy-efficient mobile computing systems
Low-power test and test-data compression of digital integrated circuits and energy-harvesting computing
Wearable and Autonomous Computing for Future Smart Cities

Connect with Bashir

Email: [email protected]

Research outputs

Coarse-grained online monitoring of BTI aging by reusing power gating infrastructure

Vasileios Tenentes, Daniele Rossi, Sheng Yang, Saqib Khursheed, Bashir M. Al-Hashimi & Steve R. Gunn, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25(4), 1397-1407

DOI: 10.1109/TVLSI.2016.2626218

Type: article

Aging benefits in nanometer CMOS designs

Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed & Bashir Al-Hashimi, 2017, IEEE Transactions on Circuits and Systems II: Express Briefs, 64(3), 324-328

DOI: 10.1109/TCSII.2016.2561206

Type: article

The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology

Basel Halak, Vasileios Tenentes & Daniele Rossi, 2016, Microelectronics Reliability, 67, 74-81

DOI: 10.1016/j.microrel.2016.10.018

Type: article

BTI aware thermal management for reliable DVFS designs

Hardeep Chahal, Vasileios Tenentes, Daniele Rossi & Bashir M. Al-Hashimi, 2016

Type: conference

Reliable power gating with NBTI aging benefits

Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed & Bashir Al-Hashimi, 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24(8), 2735 - 2744

DOI: 10.1109/TVLSI.2016.2519385

Type: article