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Research project

Resilient and Testble Energy-Efficient Digital Hardware

Staff

Lead researcher

Professor Bashir Al-Hashimi CBE, FREng, FIEEE, FIET, FBCS

Research interests

  • Energy-efficient mobile computing systems
  • Low-power test and test-data compression of digital integrated circuits and energy-harvesting computing
  • Wearable and Autonomous Computing for Future Smart Cities
Connect with Bashir

Email: [email protected]

Research outputs

Coarse-grained online monitoring of BTI aging by reusing power gating infrastructure
Vasileios Tenentes, Daniele Rossi, Sheng Yang, Saqib Khursheed, Bashir M. Al-Hashimi & Steve R. Gunn, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25(4), 1397-1407
DOI: 10.1109/TVLSI.2016.2626218
Type: article
Aging benefits in nanometer CMOS designs
Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed & Bashir Al-Hashimi, 2017, IEEE Transactions on Circuits and Systems II: Express Briefs, 64(3), 324-328
DOI: 10.1109/TCSII.2016.2561206
Type: article
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology
Basel Halak, Vasileios Tenentes & Daniele Rossi, 2016, Microelectronics Reliability, 67, 74-81
DOI: 10.1016/j.microrel.2016.10.018
Type: article
BTI aware thermal management for reliable DVFS designs
Hardeep Chahal, Vasileios Tenentes, Daniele Rossi & Bashir M. Al-Hashimi, 2016
Type: conference
Reliable power gating with NBTI aging benefits
Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed & Bashir Al-Hashimi, 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24(8), 2735 - 2744
DOI: 10.1109/TVLSI.2016.2519385
Type: article